Low-Temperature (LT) Scanning Probe Microscope (SPM)

BSA is procuring the Integration of a Low-Temperature SPM into a Multiprobe UHV Surface Analysis System. The requirement form and/or function supports the design and development of a lowtemperature scanning probe microscope (LT-SPM) and its integration into the existing multiprobe system without compromising or sacrificing any original system functionality.

The LT-SPM will include a new SPM scanner, a sample stage with seven additional electrical contacts, a removable magnetic field assembly, required internal electronics, and all necessary wiring and cabling, while utilizing an existing cryostat previously purchased from the same Supplier for a prior LT-STM system. All SPM cabling will be compatible with the existing Scienta Omicron MATRIX SPM controller.

In addition, A UHV SPM chamber will be designed and built by the Supplier in close collaboration with CFN staff to ensure full compatibility with the existing multiprobe system, enabling smooth sample and STM tip transfer between chambers and reliable SPM operation under UHV conditions.

The Supplier will install all new components within the cryostat at CFN, including internal electronics, wiring, and cabling, and will perform system performance and quality tests on an Au(111) crystal or graphite surface to demonstrate atomic resolution for both STM and AFM.