Combined synopsis and solicitation
Field-Emission Scanning Electron Microscope (FE-SEM) with Brand Name Only Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS) Detectors and Analytical Software
1333ND26QNB640581
National Institute of Standards and Technology, Department of Commerce NIST. Analytical Laboratory Instrument Manufacturing.
Awarded
$801,917.00 obligated so far on USAspending
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This one was awarded in 2026
39 like it are open now in analytical laboratory instrument manufacturing
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National Institute of Standards and Technology, Department of Commerce NIST
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Sources soughtNAICS 334516Anywhere in the USNIST-SS26-CHIPS-13Closes in 32 daysDec 3 - Sources Sought Notice for Continuous Wave Parametric Oscillator (CW OPO) Laser System
National Institute of Standards and Technology, Department of Commerce NIST
Sources soughtNAICS 334516Anywhere in the USNIST-SS26-CHIPS-16Closes in 34 daysDec 5
All 39 open in analytical laboratory instrument manufacturing
Description
As published on SAM.gov.
See attached Form SF1449 for details.
Attachments
Files listed on SAM.gov. The ones we hold a copy of download from here; the rest open SAM's download, which needs no account.
- FormSF1449.pdf2.0 MB, September 2, 2026
The contract, on USAspending
Federal procurement data the awarding office reported to FPDS, matched to this solicitation by its number.
- Recipient
- Fei Company
- UEI
- CL4ELDSNT465
- CAGE
- 1FJ95
- Vendor location
- Hillsboro, OR
- Contract
- 1333ND26PNB640659, purchase order
- Obligated
- $801,917.00, potential $1,021,322
- Actions
- 2 between September 23, 2026 and September 29, 2026
- Competition
- Competed Under SAP, 4 offers received
- Set-aside reported
- No Set Aside Used.
- Described as
- Ou63-Fy26-284-New Purchase of Field-Emission Scanning Electron Microscope
- Match
- solicitation number 1333ND26QNB640581 equals the FPDS solicitation identifier; same awarding office 1333ND (high confidence)
- Record
- USAspending award page
Publications
Every notice SAM.gov issued under this solicitation number, oldest first. Each is a separate record on SAM.
September 2, 2026
Combined synopsis and solicitation, originally sources sought
Field-Emission Scanning Electron Microscope (FE-SEM) with Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS) Detectors and Analytical Software
Due September 15, 2026 at 9:00 AM EDT. SAM.gov, notice 2b095ce246454b7e9c38436bce64826c
3 revisions on SAM
- September 2, 2026: publish, combined synopsis and solicitation
- September 2, 2026: publish, combined synopsis and solicitation
- July 17, 2026: publish, sources sought
September 2, 2026
Combined synopsis and solicitation
Due September 15, 2026 at 9:00 AM EDT. SAM.gov, notice b7ba6671e17a49348ac3480a1990027d
3 revisions on SAM
- September 2, 2026: publish, combined synopsis and solicitation
- September 2, 2026: publish, combined synopsis and solicitation
- July 17, 2026: publish, sources sought
Points of contact
- Sadaf AfkhamiSadaf.Afkhami@nist.gov3019753976