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Abierto

Solicitation, total small business set-aside

X-Ray diffractometer

LBLAM20250117

Department of Energy, Berkeley Natl Lab - DOE Contractor. Irradiation Apparatus Manufacturing.

Response deadline

February 7, 2025 at 4:00 PM EST

Closed 587 days ago. Posted January 30, 2025. Scheduled to archive February 8, 2025.

Description

As published on SAM.gov.

1 - X-RAY diffractometer. The system must meet the following minimum technical requirements and capabilities.

1) High brightness Cu x-ray source and solid-state 2D area detector. 5kW or brighter, sealed or rotating anode.

2) Automated or user interchangeable optics to enable the following X-ray measurement types: • Reflected beam optics: Bragg-Brentano, Parallel beam, Convergent spot-focused beam <500um. • Transmission beam optics: focusing optics for high resolution measurements.

3) Integrated sample mounting and software integration to enable the following:

• High-throughput sample stage for min. 96 well-plate. Software/hardware automation for alignment/measurement. • Horizontal sample mount for both high-throughput stage and single sample that has the ability to measure in both reflection and transmission mode. • Heating stage with integrated temperature control and measurement from room temperature to 1000C or greater. Must be compatible with vacuum, ambient, inert and reactive gasses, to include hydrogen gas. • Detection and guidance features to ensure proper optical path accessories are installed for the type of measurement being performed. • Must have automated beam alignment.

4) Software requirements: • Software must have a user-friendly interface, and the ability to save measurement presets and set user/administrator settings as this tool will be available as a non-specialist, multi-user capability. • Software must enable external scripting (such as Python) for automating hardware sample positioning and measurement controls. • Must include a comprehensive suite of data analysis capabilities, including: Rietveld refinement, texture analysis, whole pattern fitting, peak-fitting, thin-film reflectivity pattern analysis, and data visualization.

Publications

Every notice SAM.gov issued under this solicitation number, oldest first. Each is a separate record on SAM.

  1. January 30, 2025

    Solicitation

    Due February 7, 2025 at 4:00 PM EST. SAM.gov, notice 3b44027d70a34cf2a55200e59143436a

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