# X-Ray diffractometer

Canonical: https://abierto.us/opportunities/lblam20250117

- Solicitation number: LBLAM20250117
- Notice type: Solicitation
- Status: Closed. Deadline was February 7, 2025 at 4:00 PM EST
- Department: Department of Energy
- Contracting office: Berkeley Natl Lab - DOE Contractor (899032)
- NAICS: 334517 Irradiation Apparatus Manufacturing
- Product or service code: 6625 Electrical and Electronic Properties Measuring and Testing Instruments
- Set-aside: Total small business set-aside
- Place of performance: Berkeley, California
- County: Alameda County (FIPS 06001). https://abierto.us/counties/alameda-county-ca-06001
- City: Berkeley. https://abierto.us/cities/berkeley-ca-0606000
- First posted: January 30, 2025
- Last posted: January 30, 2025
- SAM.gov: https://sam.gov/workspace/contract/opp/3b44027d70a34cf2a55200e59143436a/view

## Description

1 - X-RAY diffractometer. The system must meet the following minimum technical requirements and capabilities.

1) High brightness Cu x-ray source and solid-state 2D area detector. 5kW or brighter, sealed or rotating anode.

2) Automated or user interchangeable optics to enable the following X-ray measurement types: • Reflected beam optics: Bragg-Brentano, Parallel beam, Convergent spot-focused beam <500um. • Transmission beam optics: focusing optics for high resolution measurements.

3) Integrated sample mounting and software integration to enable the following:

• High-throughput sample stage for min. 96 well-plate. Software/hardware automation for alignment/measurement. • Horizontal sample mount for both high-throughput stage and single sample that has the ability to measure in both reflection and transmission mode. • Heating stage with integrated temperature control and measurement from room temperature to 1000C or greater. Must be compatible with vacuum, ambient, inert and reactive gasses, to include hydrogen gas. • Detection and guidance features to ensure proper optical path accessories are installed for the type of measurement being performed. • Must have automated beam alignment.

4) Software requirements: • Software must have a user-friendly interface, and the ability to save measurement presets and set user/administrator settings as this tool will be available as a non-specialist, multi-user capability. • Software must enable external scripting (such as Python) for automating hardware sample positioning and measurement controls. • Must include a comprehensive suite of data analysis capabilities, including: Rietveld refinement, texture analysis, whole pattern fitting, peak-fitting, thin-film reflectivity pattern analysis, and data visualization.

## Publications

- January 30, 2025: Solicitation, due February 7, 2025 at 4:00 PM EST. Notice 3b44027d70a34cf2a55200e59143436a. https://sam.gov/workspace/contract/opp/3b44027d70a34cf2a55200e59143436a/view

## Points of contact

- Anita Mathias, amathias@lbl.gov

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Source: SAM.gov Contract Opportunities bulk extract. Confirm deadlines on SAM.gov before responding. Cite https://abierto.us/opportunities/lblam20250117.
