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Award notice

Automated Defect Inspection Tool

1333ND24PNB680544

National Institute of Standards and Technology, Department of Commerce NIST. Instruments and Related Products Manufacturing for Measuring, Displaying, and Controlling Industrial Process Variables.

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Awarded

Nanotronics Imaging, Inc.

$564,500.00 on the award notice, September 11, 2024, contract 1333ND24PNB680544

Description

As published on SAM.gov.

The purpose of this award was to supply, install, and train new users on an Automated Defect Inspection Tool that meets the needs of the BMF community. See attached Sole Source Justification (JOFOC-r).

The contract, on USAspending

Federal procurement data the awarding office reported to FPDS, matched to this solicitation by its number.

Recipient
Nanotronics Imaging, Inc.
UEI
DCB4CATFDRY9
CAGE
6LG73
Vendor location
Cuyahoga Falls, OH
Contract
1333ND24PNB680544, purchase order
Obligated
$564,500.00
Actions
1 between September 11, 2024 and September 11, 2024
Competition
Not Competed Under SAP, 1 offer received
Set-aside reported
No Set Aside Used.
Described as
Automated Defect Inspection Tool
Match
award number 1333ND24PNB680544 equals the contract number; same awarding office 1333ND (high confidence)
Record
USAspending award page

Publications

Every notice SAM.gov issued under this solicitation number, oldest first. Each is a separate record on SAM.

  1. September 17, 2024

    Award notice

    Awarded to NANOTRONICS IMAGING, Inc. Cuyahoga Falls for $564,500. SAM.gov, notice 583e99aa402b48d1a6ad5fcce1d2b822

  2. September 17, 2024

    Award notice

    Awarded to NANOTRONICS IMAGING, Inc. Cuyahoga Falls for $564,500. SAM.gov, notice ab2fbebc95bb450dbc67b12e017aafdf

Points of contact

Also open from this buyer