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Solicitation

Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY

W911PT26QA041

Department of the Army, W6QK ACC Wva. Electronic and Precision Equipment Repair and Maintenance.

View on SAM.govMarkdown

Awarded

TSS Microscopy, LLC

$109,500.00 obligated so far on USAspending

Description

As published on SAM.gov.

This solicitation is for the procurement of 1 LOT - Annual maintenance, support, repair and software updates to FEI Helios 600i Focused Ion Beam, (FIB) / Scanning Electron Microscope (SEM) Dual Beam per the attached Performance Work Statement (PWS) for Benet Laboratories. Wage Determination No.2015-4143 latest revision applies and is attached.

This is a Sole Source Procurement with FEI Company. All Responsible offerors will be considered.

The contract, on USAspending

Federal procurement data the awarding office reported to FPDS, matched to this solicitation by its number.

Recipient
TSS Microscopy, LLC
UEI
MVKYVAJKCC53
CAGE
75N95
Vendor location
Hillsboro, OR
Contract
W911PT26PA058, purchase order
Obligated
$109,500.00
Actions
1 between May 12, 2026 and May 12, 2026
Competition
Competed Under SAP, 2 offers received
Set-aside reported
No Set Aside Used.
Described as
Annual Maintenance, Support, Repair and Software Updates to Fei Helios 600I Focused Ion Beam (Fib) / Scanning Electron Microscope (Sem) Dual Beam for Benet Laboratories at Watervliet Arsenal, Watervliet, Ny.
Match
solicitation number W911PT26QA041 equals the FPDS solicitation identifier; same awarding office W911PT (high confidence)
Record
USAspending award page

Publications

Every notice SAM.gov issued under this solicitation number, oldest first. Each is a separate record on SAM.

  1. February 27, 2026

    Solicitation

    Due March 6, 2026 at 3:00 PM EST. SAM.gov, notice 4856abefb1334d699737e03cc67ce1bb

Points of contact

Also open from this buyer