Sources sought
Scanning Electron Microscope for X-ray Tomography
NIST-SS24-CHIPS-0026
National Institute of Standards and Technology, Department of Commerce NIST. Analytical Laboratory Instrument Manufacturing.
Response deadline
March 18, 2024 at 11:00 AM EDT
Closed 913 days ago. Posted March 4, 2024. Scheduled to archive April 2, 2024.
Description
As published on SAM.gov.
NIST is seeking information from sources that may be capable of providing a solution that meets or exceeds the following draft minimum specifications and evaluation criteria. The required item is a scanning electron microscope (SEM), which will be used as part of a novel x-ray tomography instrument. Please see attached noticed for details.
Publications
Every notice SAM.gov issued under this solicitation number, oldest first. Each is a separate record on SAM.
March 4, 2024
Sources sought
Due March 18, 2024 at 11:00 AM EDT. SAM.gov, notice 8af8ceb405ac406782e757729bb0c1dc
Points of contact
- Brandon Butlerbrandon.butler@nist.gov
- Tracy RettererTracy.retterer@nist.gov
Also open from this buyer
- Stable Isotopes for BiologicsSolicitationNAICS 325199Gaithersburg, MD1333QNB640598Closes todaySep 17
- AploPrep Liquid Handler & Nanoimager Microscope MaintenancePresolicitationNAICS 334516Gaithersburg, MDNB644020-26-01484Closes tomorrowSep 18
- Gas CylindersPresolicitationNAICS 332420Gaithersburg, MDNB305000-26-02052Closes tomorrowSep 18
- Ultra-High Vacuum (UHV) Translation StagesSolicitationNAICS 334516Gaithersburg, MD1333ND26QNB030595Closes tomorrowSep 18
- NIST Femtosecond Laser SystemCombined synopsis and solicitationNAICS 334516Gaithersburg, MD1333ND26QNB680592Closes tomorrowSep 18