Cryo-Electron Microscopy Instruments

Lawrence Berkeley National Laboratory requests a proposal for Focused Ion Beam and Scanning Transmission Electron Microscope instruments usable at cryogenic conditions for the Molecular Foundry. The final number, combination, and configuration of instruments (including options) that will be acquired is dependent on performance specifications and prices proposed, along with available funding.

The capabilities required from these instruments are as follows, listed in order of importance: High resolution TEM imaging used for single particle analysis and cryo-tomography for biological specimens under cryogenic conditions. High resolution STEM imaging for ptychography and 4D-STEM under cryogenic conditions for materials science applications. Dual beam FIB to be used for TEM sample preparation and cryogenic transfer to a TEM.

It is possible that combinations of these capabilities could be satisfied with fewer than three instruments. Offerors may propose any number of instruments that would satisfy these requirements. Please see the RFP document for full details.