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Abierto

Award notice, first published as sources sought

Plasma-focused ion beam scanning electron microsco

75N92025Q00101

National Institutes of Health, National Institutes of Health Nhlbi. Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals.

Awarded

Fei Company

$1,800,000.00 on the award notice, September 22, 2025, contract 75N92025P00391

Description

As published on SAM.gov.

Plasma-focused ion beam scanning electron microscope (FIB-SEM)

The contract, on USAspending

Federal procurement data the awarding office reported to FPDS, matched to this solicitation by its number.

Recipient
Fei Company
UEI
CL4ELDSNT465
CAGE
1FJ95
Vendor location
Hillsboro, OR
Contract
75N92025P00391, purchase order
Obligated
$1,938,545.70
Actions
2 between September 22, 2025 and July 20, 2026
Competition
Competed Under SAP, 1 offer received
Set-aside reported
No Set Aside Used.
Described as
Plasma-Focused Ion Beam Scanning Electron Microscope (Fib-Sem)
Match
award number 75N92025P00391 equals the contract number; same awarding office 75N920 (high confidence)

Publications

Every notice SAM.gov issued under this solicitation number, oldest first. Each is a separate record on SAM.

  1. August 12, 2025

    Sources sought

    Purchase of a Plasma-focused ion beam scanning electron microscope (FIB-SEM)

    Due August 19, 2025 at 12:00 PM EDT. SAM.gov, notice e66f5afc19eb4e8e8fb79c97de468191

  2. September 8, 2025

    Combined synopsis and solicitation, originally sources sought

    Purchase of a Plasma-focused ion beam scanning ele

    Due September 15, 2025 at 4:30 PM EDT. SAM.gov, notice d2214751619348c39d8584599009ab6f

  3. September 22, 2025

    Award notice

    Awarded to FEI COMPANY 5350 NE DAWSON CREEK DRIVE Hillsboro for $1,800,000. SAM.gov, notice 80c2a6c7c34c4f9384f04ebda0e6bc9f

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