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Award notice, first published as combined synopsis and solicitation

Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)

1333ND26QNB030053

National Institute of Standards and Technology, Department of Commerce NIST. Analytical Laboratory Instrument Manufacturing.

44 open like this View on SAM.gov Markdown

Awarded

Fei Company

$4,486,721.00 obligated so far on USAspending

Get the next one like this from National Institute of Standards and Technology by email, the day it is posted.Find my opportunities

This one was awarded in 2026

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All 44 open in analytical laboratory instrument manufacturing

Description

As published on SAM.gov with the combined synopsis and solicitation of February 9, 2026.

This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation#  1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details.

Attachments

Files listed on SAM.gov. The ones we hold a copy of download from here; the rest open SAM's download, which needs no account.

The contract, on USAspending

Federal procurement data the awarding office reported to FPDS, matched to this solicitation by its number.

Recipient
Fei Company
UEI
CL4ELDSNT465
CAGE
1FJ95
Vendor location
Hillsboro, OR
Contract
1333ND26PNB030039, purchase order
Obligated
$4,486,721.00
Actions
2 between March 27, 2026 and July 23, 2026
Competition
Competed Under SAP, 2 offers received
Set-aside reported
No Set Aside Used.
Described as
Ou03-Fy26-194-New Focused Ion Beam/Scanning Electron Microscope (Fib/Sem) with 5 Years Service/Maintenance.
Match
award number 1333ND26PNB030039 equals the contract number; same awarding office 1333ND (high confidence)
Record
USAspending award page

Publications

Every notice SAM.gov issued under this solicitation number, oldest first. Each is a separate record on SAM.

  1. February 9, 2026

    Combined synopsis and solicitation

    Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument

    Due February 23, 2026 at 4:30 PM EST. SAM.gov, notice c7581827b97a4646a242778fd96a1049

    1 revisions on SAM
    • February 9, 2026: publish, combined synopsis and solicitation

  2. April 6, 2026

    Award notice

    Awarded to Fei Company for $4,486,721. SAM.gov, notice dd96e5e5b43342f2a8c8899af4e24d7b

    1 revisions on SAM
    • April 6, 2026: publish, award notice

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