CHIPS R&D: NARROW BAND MID-IR LASER

This combined synopsis/solicitation is hereby cancelled in its entirety. The National Institute of Standards and Technology (NIST) CHIPS metrology program has a requirement for a narrowband, mid-IR laser with tunable wavelength and tunable repetition rate to enhance advanced AFM metrology for measuring chemical composition and thermal properties of materials at the nanoscale which are being developed in the Nanoscale Device Characterization Division (NDCD), e.g., Nano Lett. 2022, 22, 11, 4325–4332.

The CHIPS Metrology Program at NIST advances metrology for accelerating R&D and for developing breakthroughs that support the development of the next-generation microelectronics and ensure the competitiveness and leadership of the United States. The development and advancement of new measurement methods and infrastructure to characterize nanoscale engineered materials and devices is a critical part of the CHIPS metrology and NDCD mission. PLEASE SEE ATTACHMENTS FOR THE COMPLETE DETAILS AND MINIMUM REQUIREMENTS