{"canonical":"https://abierto.us/opportunities/80ksc024rfi0001","key":"80KSC024RFI0001","url":"https://abierto.us/opportunities/80ksc024rfi0001","title":"Integrated High-Vacuum Atomic Force Microscopy","solicitation_number":"80KSC024RFI0001","notice_type":"r","open":false,"response_deadline":"2024-07-24T16:00:00Z","first_posted":"2024-07-08","last_posted":"2024-07-15","department":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION","subagency":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION","office":"NASA KENNEDY SPACE CENTER","naics":"334516","psc":"6640","set_aside":null,"place_state":"FL","place_county":"12009","place_county_name":"Brevard County","place_city":"1244275","place_city_name":"Merritt Island","winner":null,"award_amount":null,"publications":[{"notice_id":"9e9fd7e80d45404cae886bf6ac2f7785","title":"Integrated High-Vacuum Atomic Force Microscopy","solicitation_number":"80KSC024RFI0001","notice_type":"r","base_type":"r","posted":"2024-07-08","posted_at":null,"due_at":"2024-07-22T16:00:00Z","due_date":"2024-07-22","cancelled":null,"archived":null,"archive_date":"2024-08-06","award_number":null,"awardee_name":null,"amount":null,"link_sam":"https://sam.gov/workspace/contract/opp/9e9fd7e80d45404cae886bf6ac2f7785/view","enriched":false,"history":[]},{"notice_id":"f014465092d543c69c9c57da78675ed3","title":"Integrated High-Vacuum Atomic Force Microscopy","solicitation_number":"80KSC024RFI0001","notice_type":"r","base_type":"r","posted":"2024-07-08","posted_at":null,"due_at":"2024-07-22T16:00:00Z","due_date":"2024-07-22","cancelled":null,"archived":null,"archive_date":"2024-07-09","award_number":null,"awardee_name":null,"amount":null,"link_sam":"https://sam.gov/workspace/contract/opp/f014465092d543c69c9c57da78675ed3/view","enriched":false,"history":[]},{"notice_id":"80e13908c11a424c9e590544606b48b0","title":"Integrated High-Vacuum Atomic Force Microscopy","solicitation_number":"80KSC024RFI0001","notice_type":"r","base_type":"r","posted":"2024-07-10","posted_at":null,"due_at":"2024-07-24T16:00:00Z","due_date":"2024-07-24","cancelled":null,"archived":null,"archive_date":"2024-08-08","award_number":null,"awardee_name":null,"amount":null,"link_sam":"https://sam.gov/workspace/contract/opp/80e13908c11a424c9e590544606b48b0/view","enriched":false,"history":[]},{"notice_id":"dca496bad1d840aab4d059282ba13404","title":"Integrated High-Vacuum Atomic Force Microscopy","solicitation_number":"80KSC024RFI0001","notice_type":"r","base_type":"r","posted":"2024-07-10","posted_at":null,"due_at":"2024-07-24T16:00:00Z","due_date":"2024-07-24","cancelled":null,"archived":null,"archive_date":"2024-08-08","award_number":null,"awardee_name":null,"amount":null,"link_sam":"https://sam.gov/workspace/contract/opp/dca496bad1d840aab4d059282ba13404/view","enriched":false,"history":[]},{"notice_id":"1451ecafeec64350b0bf082b691ecf5b","title":"Integrated High-Vacuum Atomic Force Microscopy","solicitation_number":"80KSC024RFI0001","notice_type":"r","base_type":"r","posted":"2024-07-15","posted_at":null,"due_at":"2024-07-24T16:00:00Z","due_date":"2024-07-24","cancelled":null,"archived":null,"archive_date":"2024-08-08","award_number":null,"awardee_name":null,"amount":null,"link_sam":"https://sam.gov/workspace/contract/opp/1451ecafeec64350b0bf082b691ecf5b/view","enriched":false,"history":[]}],"latest_notice_id":"1451ecafeec64350b0bf082b691ecf5b","first_type":"r","notices":[{"dates":{"posted":"2024-07-08","response_deadline":{"raw":"2024-07-22T12:00:00-04:00","utc":"2024-07-22T16:00:00Z","date":"2024-07-22","time":"12:00:00","utc_offset_seconds":-14400}},"links":{"sam":"https://sam.gov/workspace/contract/opp/9e9fd7e80d45404cae886bf6ac2f7785/view"},"naics":{"codes":["334516"],"primary":"334516"},"title":"Integrated High-Vacuum Atomic Force Microscopy","agency":{"office":{"code":"80KSC0","name":"NASA KENNEDY SPACE CENTER"},"subtier":{"code":"8000","name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION"},"department":{"code":"080","name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION"},"office_address":{"zip":"32899","city":"KENNEDY SPACE CENTER","state":"FL","country":"USA"},"organization_type":"OFFICE"},"status":{"active":false,"archive_date":"2024-08-06","archive_type":"auto15"},"contacts":[{"name":"Kodi Coles","role":"primary","email":"kodi.d.coles@nasa.gov","phone":"3218670299"}],"base_type":{"code":"r","label":"Sources Sought"},"notice_id":"9e9fd7e80d45404cae886bf6ac2f7785","provenance":{"extract":{"url":"https://s3.amazonaws.com/falextracts/Contract%20Opportunities/Archived%20Data/FY2024_archived_opportunities.csv","etag":"\"d582488fe153a9f11bf629913d176ffc-137\"","fetched_at":"2026-09-16T19:07:39.720164Z","row_sha256":"3829453bc23d7c7d7f498fe0c862b1b01cce2b7ab4465b86102c3b2e06b4b675","last_modified":"2026-09-13T14:47:40Z"},"updated_at":"2026-09-16T19:07:39.720164Z","first_seen_at":"2026-09-16T19:07:39.720164Z"},"description":{"text":"1. Introduction The Electrostatics and Surface Physics Laboratory (ESPL) at the NASA Kennedy Space Center (KSC) is looking to procure an integrated high-vacuum atomic force microscopy (AFM) system. The system will be used to measure atomic-level forces of various materials, including adhesion and electrostatic forces. It will also be used to generate topographical maps of different surfaces. This system must follow the requirements as listed in Section 2. The required period of performance is described in Section 3. 2.Technical Requirements System shall consist of flexure-guided XY scanner, AFM head, multiple sample mount, motorized XY stage, motorized Z stage, motorized focus stage, direct on-axis optics, integrated active vibration isolation, vacuum chamber, high-vacuum controller, vacuum instrument controller, vacuum pumps (dry backing pump, turbomolecular pump), control electronics, AFM software, image analysis software, vacuum manager software, computer, monitors, cabinet, and table. System shall use coordinate frame defined by the vendor and use that coordinate frame for compliance to these requirements. System shall be instrumented to performing AFM, Scanning probe microscopy (SPM), Electrostatic Force Microscopy (EFM), Lateral Force Microscopy (LFM), and Kelvin Probe Force Microscopy (KPFM). System shall quantitatively measure adhesion forces on a sample. System shall quantitatively measure surface potential and work function on a sample. System shall enable adjustment of all software functions and settings. System shall provide and/or enable scripting by the customer for automating data acquisition. System shall have a Computer with Windows OS installed to interface with all measurement equipment. System shall have a minimum 100 µm x 100 µm x 15 µm X, Y, and Z scan range, respectively. System shall have no less than 20-bit XYZ positional accuracy. System shall have no less than 20-bit XYZ positional control. System shall detect deflection of the cantilever on the AFM Head using the Super Luminescent Diode (SLD) that does not interfere optically. System shall align the SLD to an accuracy of 5% of the baseline measurement. System shall be capable of removing the AFM head, verified by customer demonstration. Vendor shall provide a multi-sample plate with up to five sample plates no smaller than 10 x 10 x 20 mm (X, Y, Z) in volume that is compatible with the system. Vendor shall provide a single sample plate no smaller than 100 x 100 x 20 mm in volume that is compatible with the system. System shall enable a sample no less than 8 mm x 10 mm x 20 mm to reach at minimum 250 °C to support AFM imaging. System shall control sample temperature to within +/- 10 °C. System shall be capable of monitoring the sample temperature to a minimum resolution of 1 °C. Sample temperature shall not affect visual or AFM image quality. System shall be capable of positioning samples to within a 22 mm x 22 mm x 24 mm volume in the XYZ direction, respectively with an accuracy of no greater than 0.08 µm. System shall have a CCD camera with no less than 5 MP to view samples. System’s Camera shall have a focal travel range of 11 mm with an accuracy of no worse than 0.1 µm. System’s Camera shall have a Field of View of 840 µm x 630 µm with a 10 mm x 10 mm pan range. System shall have software-controllable LED illumination. System shall be capable of going to 10-5 torr from 760 torr. Vacuum sensors shall have an accuracy of no greater than +/- 20% of measurement from 10-5 to 10-3 torr, +/- 10% from 10-3 to 100 torr, and +/- 50% from 100 torr to 800 torr. Systems shall have a vacuum chamber no less than 250 mm x 320 mm x 270 mm. System shall control vacuum levels to the same resolution as the vacuum sensor measurement. System shall provide pump-down instructions to the customer at delivery. System shall dampen floor noise (1 to 200 Hz) to ensure no loss of measurement accuracy. System shall have at least 17 Digital-Analog Converters (DACs) for signal generation, with at least 2 high-speed 16-bit DACs. System shall have at least 18 Analog Digital Converters (ADC) for signal acquisition, with at least 4 high-speed 16-bit ADCs. System shall have 6 digital I/Os in LV-TTL for image frame, line, pixel, cantilever modulation sync, tip bias-modulation sync, and alarm. System shall have at least 100 Mbps communications with the computer interface. Vendor shall provide at least 10 pre-mounted contact cantilevers and 10 pre-mounted non-contact cantilevers. Vendor shall calibrate the AFM cantilever via a thermal vibration method. 3. Period of Performance Vendor shall deliver the complete system within 4 months of receiving the contract reward. Vendor shall provide a design data package (including parts list, integrated schematics, manuals, and published drawings) of the complete system within 2 months of receiving the contract award. Vendor shall provide on-site installation and training of no less than 4 days within 1 month of system delivery. Vendor shall supply a warranty of no less than 1 year from delivery that includes troubleshoot support, and part replacement and repair.","origin":"extract"},"notice_type":{"code":"r","label":"Sources Sought"},"schema_version":1,"solicitation_number":"80KSC024RFI0001","place_of_performance":{"city":{"name":"Merritt Island"},"state":{"code":"FL"},"country":{"code":"USA"}},"product_service_code":"6640"},{"dates":{"posted":"2024-07-08","response_deadline":{"raw":"2024-07-22T12:00:00-04:00","utc":"2024-07-22T16:00:00Z","date":"2024-07-22","time":"12:00:00","utc_offset_seconds":-14400}},"links":{"sam":"https://sam.gov/workspace/contract/opp/f014465092d543c69c9c57da78675ed3/view"},"naics":{"codes":["334516"],"primary":"334516"},"title":"Integrated High-Vacuum Atomic Force Microscopy","agency":{"office":{"code":"80KSC0","name":"NASA KENNEDY SPACE CENTER"},"subtier":{"code":"8000","name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION"},"department":{"code":"080","name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION"},"office_address":{"zip":"32899","city":"KENNEDY SPACE CENTER","state":"FL","country":"USA"},"organization_type":"OFFICE"},"status":{"active":false,"archive_date":"2024-07-09","archive_type":"manual"},"contacts":[{"name":"Kodi Coles","role":"primary","email":"kodi.d.coles@nasa.gov","phone":"3218670299"}],"base_type":{"code":"r","label":"Sources Sought"},"notice_id":"f014465092d543c69c9c57da78675ed3","provenance":{"extract":{"url":"https://s3.amazonaws.com/falextracts/Contract%20Opportunities/Archived%20Data/FY2024_archived_opportunities.csv","etag":"\"d582488fe153a9f11bf629913d176ffc-137\"","fetched_at":"2026-09-16T19:07:39.720164Z","row_sha256":"cb98cb21093120f05b72b53c9a8e472bb48b9a521fc378bb54c28ad9903796a7","last_modified":"2026-09-13T14:47:40Z"},"updated_at":"2026-09-16T19:07:39.720164Z","first_seen_at":"2026-09-16T19:07:39.720164Z"},"description":{"text":"1. Introduction The Electrostatics and Surface Physics Laboratory (ESPL) at the NASA Kennedy Space Center (KSC) is looking to procure an integrated high-vacuum atomic force microscopy (AFM) system. The system will be used to measure atomic-level forces of various materials, including adhesion and electrostatic forces. It will also be used to generate topographical maps of different surfaces. This system must follow the requirements as listed in Section 2. The required period of performance is described in Section 3. 2.Technical Requirements System shall consist of flexure-guided XY scanner, AFM head, multiple sample mount, motorized XY stage, motorized Z stage, motorized focus stage, direct on-axis optics, integrated active vibration isolation, vacuum chamber, high-vacuum controller, vacuum instrument controller, vacuum pumps (dry backing pump, turbomolecular pump), control electronics, AFM software, image analysis software, vacuum manager software, computer, monitors, cabinet, and table. System shall use coordinate frame defined by the vendor and use that coordinate frame for compliance to these requirements. System shall be instrumented to performing AFM, Scanning probe microscopy (SPM), Electrostatic Force Microscopy (EFM), Lateral Force Microscopy (LFM), and Kelvin Probe Force Microscopy (KPFM). System shall quantitatively measure adhesion forces on a sample. System shall quantitatively measure surface potential and work function on a sample. System shall enable adjustment of all software functions and settings. System shall provide and/or enable scripting by the customer for automating data acquisition. System shall have a Computer with Windows OS installed to interface with all measurement equipment. System shall have a minimum 100 µm x 100 µm x 15 µm X, Y, and Z scan range, respectively. System shall have no less than 20-bit XYZ positional accuracy. System shall have no less than 20-bit XYZ positional control. System shall detect deflection of the cantilever on the AFM Head using the Super Luminescent Diode (SLD) that does not interfere optically. System shall align the SLD to an accuracy of 5% of the baseline measurement. System shall be capable of removing the AFM head, verified by customer demonstration. Vendor shall provide a multi-sample plate with up to five sample plates no smaller than 10 x 10 x 20 mm (X, Y, Z) in volume that is compatible with the system. Vendor shall provide a single sample plate no smaller than 100 x 100 x 20 mm in volume that is compatible with the system. System shall enable a sample no less than 8 mm x 10 mm x 20 mm to reach at minimum 250 °C to support AFM imaging. System shall control sample temperature to within +/- 10 °C. System shall be capable of monitoring the sample temperature to a minimum resolution of 1 °C. Sample temperature shall not affect visual or AFM image quality. System shall be capable of positioning samples to within a 22 mm x 22 mm x 24 mm volume in the XYZ direction, respectively with an accuracy of no greater than 0.08 µm. System shall have a CCD camera with no less than 5 MP to view samples. System’s Camera shall have a focal travel range of 11 mm with an accuracy of no worse than 0.1 µm. System’s Camera shall have a Field of View of 840 µm x 630 µm with a 10 mm x 10 mm pan range. System shall have software-controllable LED illumination. System shall be capable of going to 10-5 torr from 760 torr. Vacuum sensors shall have an accuracy of no greater than +/- 20% of measurement from 10-5 to 10-3 torr, +/- 10% from 10-3 to 100 torr, and +/- 50% from 100 torr to 800 torr. Systems shall have a vacuum chamber no less than 250 mm x 320 mm x 270 mm. System shall control vacuum levels to the same resolution as the vacuum sensor measurement. System shall provide pump-down instructions to the customer at delivery. System shall dampen floor noise (1 to 200 Hz) to ensure no loss of measurement accuracy. System shall have at least 17 Digital-Analog Converters (DACs) for signal generation, with at least 2 high-speed 16-bit DACs. System shall have at least 18 Analog Digital Converters (ADC) for signal acquisition, with at least 4 high-speed 16-bit ADCs. System shall have 6 digital I/Os in LV-TTL for image frame, line, pixel, cantilever modulation sync, tip bias-modulation sync, and alarm. System shall have at least 100 Mbps communications with the computer interface. Vendor shall provide at least 10 pre-mounted contact cantilevers and 10 pre-mounted non-contact cantilevers. Vendor shall calibrate the AFM cantilever via a thermal vibration method. 3. Period of Performance Vendor shall deliver the complete system within 4 months of receiving the contract reward. Vendor shall provide a design data package (including parts list, integrated schematics, manuals, and published drawings) of the complete system within 2 months of receiving the contract award. Vendor shall provide on-site installation and training of no less than 4 days within 1 month of system delivery. Vendor shall supply a warranty of no less than 1 year from delivery that includes troubleshoot support, and part replacement and repair.","origin":"extract"},"notice_type":{"code":"r","label":"Sources Sought"},"schema_version":1,"solicitation_number":"80KSC024RFI0001","place_of_performance":{"city":{"name":"Merritt Island"},"state":{"code":"FL"},"country":{"code":"USA"}},"product_service_code":"6640"},{"dates":{"posted":"2024-07-10","response_deadline":{"raw":"2024-07-24T12:00:00-04:00","utc":"2024-07-24T16:00:00Z","date":"2024-07-24","time":"12:00:00","utc_offset_seconds":-14400}},"links":{"sam":"https://sam.gov/workspace/contract/opp/80e13908c11a424c9e590544606b48b0/view"},"naics":{"codes":["334516"],"primary":"334516"},"title":"Integrated High-Vacuum Atomic Force Microscopy","agency":{"office":{"code":"80KSC0","name":"NASA KENNEDY SPACE CENTER"},"subtier":{"code":"8000","name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION"},"department":{"code":"080","name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION"},"office_address":{"zip":"32899","city":"KENNEDY SPACE CENTER","state":"FL","country":"USA"},"organization_type":"OFFICE"},"status":{"active":false,"archive_date":"2024-08-08","archive_type":"auto15"},"contacts":[{"name":"Kodi Coles","role":"primary","email":"kodi.d.coles@nasa.gov","phone":"3218670299"}],"base_type":{"code":"r","label":"Sources Sought"},"notice_id":"80e13908c11a424c9e590544606b48b0","provenance":{"extract":{"url":"https://s3.amazonaws.com/falextracts/Contract%20Opportunities/Archived%20Data/FY2024_archived_opportunities.csv","etag":"\"d582488fe153a9f11bf629913d176ffc-137\"","fetched_at":"2026-09-16T19:07:39.720164Z","row_sha256":"a66ea0354408a65d384524434c58517ea8d91656f1beaaebf475b373eda909cc","last_modified":"2026-09-13T14:47:40Z"},"updated_at":"2026-09-16T19:07:39.720164Z","first_seen_at":"2026-09-16T19:07:39.720164Z"},"description":{"text":"1. Introduction The Electrostatics and Surface Physics Laboratory (ESPL) at the NASA Kennedy Space Center (KSC) is looking to procure an integrated high-vacuum atomic force microscopy (AFM) system. The system will be used to measure atomic-level forces of various materials, including adhesion and electrostatic forces. It will also be used to generate topographical maps of different surfaces. This system must follow the requirements as listed in Section 2. The required period of performance is described in Section 3. 2.Technical Requirements System shall consist of flexure-guided XY scanner, AFM head, multiple sample mount, motorized XY stage, motorized Z stage, motorized focus stage, direct on-axis optics, integrated active vibration isolation, vacuum chamber, high-vacuum controller, vacuum instrument controller, vacuum pumps (dry backing pump, turbomolecular pump), control electronics, AFM software, image analysis software, vacuum manager software, computer, monitors, cabinet, and table. System shall use coordinate frame defined by the vendor and use that coordinate frame for compliance to these requirements. System shall be instrumented to performing AFM, Scanning probe microscopy (SPM), Electrostatic Force Microscopy (EFM), Lateral Force Microscopy (LFM), and Kelvin Probe Force Microscopy (KPFM). System shall quantitatively measure adhesion forces on a sample. System shall quantitatively measure surface potential and work function on a sample. System shall enable adjustment of all software functions and settings. System shall provide and/or enable scripting by the customer for automating data acquisition. System shall have a Computer with Windows OS installed to interface with all measurement equipment. System shall have a minimum 100 µm x 100 µm x 15 µm X, Y, and Z scan range, respectively. System shall have no less than 20-bit XYZ positional accuracy. System shall have no less than 20-bit XYZ positional control. System shall detect deflection of the cantilever on the AFM Head using the Super Luminescent Diode (SLD) that does not interfere optically. System shall align the SLD to an accuracy of 5% of the baseline measurement. System shall be capable of removing the AFM head, verified by customer demonstration. Vendor shall provide a multi-sample plate with up to five sample plates no smaller than 10 x 10 x 20 mm (X, Y, Z) in volume that is compatible with the system. Vendor shall provide a single sample plate no smaller than 100 x 100 x 20 mm in volume that is compatible with the system. System shall enable a sample no less than 8 mm x 10 mm x 20 mm to reach at minimum 250 °C to support AFM imaging. System shall control sample temperature to within +/- 10 °C. System shall be capable of monitoring the sample temperature to a minimum resolution of 1 °C. Sample temperature shall not affect visual or AFM image quality. System shall be capable of positioning samples to within a 22 mm x 22 mm x 24 mm volume in the XYZ direction, respectively with an accuracy of no greater than 0.08 µm. System shall have a CCD camera with no less than 5 MP to view samples. System’s Camera shall have a focal travel range of 11 mm with an accuracy of no worse than 0.1 µm. System’s Camera shall have a Field of View of 840 µm x 630 µm with a 10 mm x 10 mm pan range. System shall have software-controllable LED illumination. System shall be capable of going to 10-5 torr from 760 torr. Vacuum sensors shall have an accuracy of no greater than +/- 20% of measurement from 10-5 to 10-3 torr, +/- 10% from 10-3 to 100 torr, and +/- 50% from 100 torr to 800 torr. Systems shall have a vacuum chamber no less than 250 mm x 320 mm x 270 mm. System shall control vacuum levels to the same resolution as the vacuum sensor measurement. System shall provide pump-down instructions to the customer at delivery. System shall dampen floor noise (1 to 200 Hz) to ensure no loss of measurement accuracy. System shall have at least 17 Digital-Analog Converters (DACs) for signal generation, with at least 2 high-speed 16-bit DACs. System shall have at least 18 Analog Digital Converters (ADC) for signal acquisition, with at least 4 high-speed 16-bit ADCs. System shall have 6 digital I/Os in LV-TTL for image frame, line, pixel, cantilever modulation sync, tip bias-modulation sync, and alarm. System shall have at least 100 Mbps communications with the computer interface. Vendor shall provide at least 10 pre-mounted contact cantilevers and 10 pre-mounted non-contact cantilevers. Vendor shall calibrate the AFM cantilever via a thermal vibration method. 3. Period of Performance Vendor shall deliver the complete system within 4 months of receiving the contract reward. Vendor shall provide a design data package (including parts list, integrated schematics, manuals, and published drawings) of the complete system within 2 months of receiving the contract award. Vendor shall provide on-site installation and training of no less than 4 days within 1 month of system delivery. Vendor shall supply a warranty of no less than 1 year from delivery that includes troubleshoot support, and part replacement and repair.","origin":"extract"},"notice_type":{"code":"r","label":"Sources Sought"},"schema_version":1,"solicitation_number":"80KSC024RFI0001","place_of_performance":{"city":{"name":"Merritt Island"},"state":{"code":"FL"},"country":{"code":"USA"}},"product_service_code":"6640"},{"dates":{"posted":"2024-07-10","response_deadline":{"raw":"2024-07-24T12:00:00-04:00","utc":"2024-07-24T16:00:00Z","date":"2024-07-24","time":"12:00:00","utc_offset_seconds":-14400}},"links":{"sam":"https://sam.gov/workspace/contract/opp/dca496bad1d840aab4d059282ba13404/view"},"naics":{"codes":["334516"],"primary":"334516"},"title":"Integrated High-Vacuum Atomic Force Microscopy","agency":{"office":{"code":"80KSC0","name":"NASA KENNEDY SPACE CENTER"},"subtier":{"code":"8000","name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION"},"department":{"code":"080","name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION"},"office_address":{"zip":"32899","city":"KENNEDY SPACE CENTER","state":"FL","country":"USA"},"organization_type":"OFFICE"},"status":{"active":false,"archive_date":"2024-08-08","archive_type":"auto15"},"contacts":[{"name":"Kodi Coles","role":"primary","email":"kodi.d.coles@nasa.gov","phone":"3218670299"}],"base_type":{"code":"r","label":"Sources Sought"},"notice_id":"dca496bad1d840aab4d059282ba13404","provenance":{"extract":{"url":"https://s3.amazonaws.com/falextracts/Contract%20Opportunities/Archived%20Data/FY2024_archived_opportunities.csv","etag":"\"d582488fe153a9f11bf629913d176ffc-137\"","fetched_at":"2026-09-16T19:07:39.720164Z","row_sha256":"c44cb4f76f32da8eeb6a035b05d25b3fc5843ca9d865c198dff0b87be3ac44fb","last_modified":"2026-09-13T14:47:40Z"},"updated_at":"2026-09-16T19:07:39.720164Z","first_seen_at":"2026-09-16T19:07:39.720164Z"},"description":{"text":"Integrated High-Vacuum Atomic Force Microscopy Kennedy Space Center (KSC) Request for Information (RFI) NASA Kennedy Space Center (KSC) is hereby soliciting information from potential sources for Integrated High-Vacuum Atomic Force Microscopy. The NASA Kennedy Space Center (KSC) is seeking capability statements from all interested parties, including all socioeconomic categories of Small Businesses and Historically Black Colleges and Universities (HBCU)/Minority Institutions (MI), and members of the underserved communities as defined by Executive Order 13985, Advancing Racial Equity And Support For Underserved Communities Through The Federal Government, for the purposes of determining the appropriate level of competition and/or small business subcontracting goals for Integrated High-Vacuum Atomic Force Microscopy. The Government reserves the right to consider a Small, 8(a), Women-owned (WOSB), Service-Disabled Veteran (SD-VOSB), Economically Disadvantaged Women-owned Small Business (EDWOSB) or HUBZone business set-aside based on responses received. See Attachment 1 for the requirements document. No solicitation exists; therefore, do not request a copy of the solicitation. If a solicitation is released, it will be synopsized on SAM.gov. Interested firms are responsible for monitoring this website for the release of any solicitation or synopsis. Vendors having the capabilities necessary to meet or exceed the stated requirements are invited to submit appropriate documentation, literature, brochures, and references. In responding to this notice, please DO NOT PROVIDE PROPRIETARY INFORMATION. HOW TO RESPOND TO THIS NOTICE: Provide the complete name of your company, address, name of contact for follow-up questions, their email, their phone number and, if your company has an active registration in https://sam.gov, your company’s Unique Entity ID (UEI). Identify laboratory equipment that your company sells that is of the nature addressed in the Attachment 1 of this notice. Include brand name, make, model, and/or other distinguishing information. State if your company is the manufacturer of the identified equipment or is a retailer or wholesaler that normally sells the identified equipment. If the latter, indicate whether the manufacturer authorized in writing for your company to sell the identified equipment on behalf of the manufacturer. Identify any aspects of this market research notice, including instructions, and draft minimum specifications that could be viewed as unduly restrictive or contain unnecessary barriers that adversely affect your ability to fully participate and indicate why. In such a scenario, please offer suggestions for how the market research notice and draft minimum specifications could be made more inclusive and competitive. For the NAICS code listed in this notice: Indicate whether your company is (a) a small business or (b) other than small business. If you believe the NAICS code listed in this notice is not the best NAICS code for the type of product addressed in this notice, identify an alternative NAICS code that you believe would be more appropriate for the planned procurement. Describe standard terms and conditions of sale offered by your company for the aforementioned equipment such as: delivery time after your company accepts the order; FOB shipping terms: manufacturer warranty (including details regarding nature and duration); if available, description(s) of available extended warranty; equipment setup and test; operator and service instruction manual(s); cleanup after installation; and if applicable, other offered services. Provide a copy of manufacturer standard terms and conditions that typically relate to the sale of the specified equipment, if available. State published price, discount, or rebate arrangements for aforementioned equipment; and/or provide link to access company’s published prices for equipment and services. If the aforementioned equipment and related services are available for purchase on any existing Federal Supply Schedule contract(s) or other contracts against which may be able place orders, identify the contract number(s) and other relevant information. Please advise if the requirement is considered to be a commercial or commercial-type product. A commercial item is defined in FAR 2.101. Additionally, in support of the Executive Order (EO) 13985, Advancing Racial Equity and Support for Underserved Communities Through the Federal Government, NASA is seeking to advance equity or remove barriers for members of underserved communities related to this requirement. As defined in the EO, Underserved Communities refers to populations sharing a particular characteristic, as well as geographic communities, that have been systematically denied a full opportunity to participate in aspects of economic, social, and civic life, as exemplified by the list in the preceding definition of \"equity.\" Equity means the consistent and systematic fair, just, and impartial treatment of all individuals, including individuals who belong to underserved communities that have been denied such treatment, such as Black, Latino, and Indigenous and Native American persons, Asian Americans and Pacific Islanders and other persons of color; members of religious minorities; lesbian, gay, bisexual, transgender, and queer (LGBTQ+) persons; persons with disabilities; persons who live in rural areas; and persons otherwise adversely affected by persistent poverty or inequality. All comments or questions shall be submitted electronically via email to kodi.d.coles@nasa.gov, no later than July 22, 2024, 12:00PM Eastern Standard Time. The response shall be submitted electronically as a Microsoft Word .doc, Adobe .pdf, and/or Microsoft EXCEL .xls file. NASA Clause 1852.215-84, Ombudsman, is applicable. The Center Ombudsman for this acquisition can be found at : https://www.hq.nasa.gov/office/procurement/regs/Procurement-Ombuds-Comp-Advocate-Listing.pdf This synopsis is for information and planning purposes only and is not to be construed as a commitment by the Government nor will the Government pay for information solicited. Respondents will not be notified of the results of the evaluation.","origin":"extract"},"notice_type":{"code":"r","label":"Sources Sought"},"schema_version":1,"solicitation_number":"80KSC024RFI0001","place_of_performance":{"city":{"name":"Merritt Island"},"state":{"code":"FL"},"country":{"code":"USA"}},"product_service_code":"6640"},{"dates":{"posted":"2024-07-15","response_deadline":{"raw":"2024-07-24T12:00:00-04:00","utc":"2024-07-24T16:00:00Z","date":"2024-07-24","time":"12:00:00","utc_offset_seconds":-14400}},"links":{"sam":"https://sam.gov/workspace/contract/opp/1451ecafeec64350b0bf082b691ecf5b/view"},"naics":{"codes":["334516"],"primary":"334516"},"title":"Integrated High-Vacuum Atomic Force Microscopy","agency":{"office":{"code":"80KSC0","name":"NASA KENNEDY SPACE CENTER"},"subtier":{"code":"8000","name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION"},"department":{"code":"080","name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION"},"office_address":{"zip":"32899","city":"KENNEDY SPACE CENTER","state":"FL","country":"USA"},"organization_type":"OFFICE"},"status":{"active":false,"archive_date":"2024-08-08","archive_type":"auto15"},"contacts":[{"name":"Kodi Coles","role":"primary","email":"kodi.d.coles@nasa.gov","phone":"3218670299"}],"base_type":{"code":"r","label":"Sources Sought"},"notice_id":"1451ecafeec64350b0bf082b691ecf5b","provenance":{"extract":{"url":"https://s3.amazonaws.com/falextracts/Contract%20Opportunities/Archived%20Data/FY2024_archived_opportunities.csv","etag":"\"d582488fe153a9f11bf629913d176ffc-137\"","fetched_at":"2026-09-16T19:07:39.720164Z","row_sha256":"493cfab7b1ccb234ab589e3ce8e1ac23fe38aff12147a1a1a395ba2c7ab54803","last_modified":"2026-09-13T14:47:40Z"},"updated_at":"2026-09-16T19:07:39.720164Z","first_seen_at":"2026-09-16T19:07:39.720164Z"},"description":{"text":"Integrated High-Vacuum Atomic Force Microscopy Kennedy Space Center (KSC) Request for Information (RFI) NASA Kennedy Space Center (KSC) is hereby soliciting information from potential sources for Integrated High-Vacuum Atomic Force Microscopy. The NASA Kennedy Space Center (KSC) is seeking capability statements from all interested parties, including all socioeconomic categories of Small Businesses and Historically Black Colleges and Universities (HBCU)/Minority Institutions (MI), and members of the underserved communities as defined by Executive Order 13985, Advancing Racial Equity And Support For Underserved Communities Through The Federal Government, for the purposes of determining the appropriate level of competition and/or small business subcontracting goals for Integrated High-Vacuum Atomic Force Microscopy. The Government reserves the right to consider a Small, 8(a), Women-owned (WOSB), Service-Disabled Veteran (SD-VOSB), Economically Disadvantaged Women-owned Small Business (EDWOSB) or HUBZone business set-aside based on responses received. See Attachment 1 for the requirements document. No solicitation exists; therefore, do not request a copy of the solicitation. If a solicitation is released, it will be synopsized on SAM.gov. Interested firms are responsible for monitoring this website for the release of any solicitation or synopsis. Vendors having the capabilities necessary to meet or exceed the stated requirements are invited to submit appropriate documentation, literature, brochures, and references. In responding to this notice, please DO NOT PROVIDE PROPRIETARY INFORMATION. HOW TO RESPOND TO THIS NOTICE: Provide the complete name of your company, address, name of contact for follow-up questions, their email, their phone number and, if your company has an active registration in https://sam.gov, your company’s Unique Entity ID (UEI). Identify laboratory equipment that your company sells that is of the nature addressed in the Attachment 1 of this notice. Include brand name, make, model, and/or other distinguishing information. State if your company is the manufacturer of the identified equipment or is a retailer or wholesaler that normally sells the identified equipment. If the latter, indicate whether the manufacturer authorized in writing for your company to sell the identified equipment on behalf of the manufacturer. Identify any aspects of this market research notice, including instructions, and draft minimum specifications that could be viewed as unduly restrictive or contain unnecessary barriers that adversely affect your ability to fully participate and indicate why. In such a scenario, please offer suggestions for how the market research notice and draft minimum specifications could be made more inclusive and competitive. For the NAICS code listed in this notice: Indicate whether your company is (a) a small business or (b) other than small business. If you believe the NAICS code listed in this notice is not the best NAICS code for the type of product addressed in this notice, identify an alternative NAICS code that you believe would be more appropriate for the planned procurement. Describe standard terms and conditions of sale offered by your company for the aforementioned equipment such as: delivery time after your company accepts the order; FOB shipping terms: manufacturer warranty (including details regarding nature and duration); if available, description(s) of available extended warranty; equipment setup and test; operator and service instruction manual(s); cleanup after installation; and if applicable, other offered services. Provide a copy of manufacturer standard terms and conditions that typically relate to the sale of the specified equipment, if available. State published price, discount, or rebate arrangements for aforementioned equipment; and/or provide link to access company’s published prices for equipment and services. If the aforementioned equipment and related services are available for purchase on any existing Federal Supply Schedule contract(s) or other contracts against which may be able place orders, identify the contract number(s) and other relevant information. Please advise if the requirement is considered to be a commercial or commercial-type product. A commercial item is defined in FAR 2.101. Additionally, in support of the Executive Order (EO) 13985, Advancing Racial Equity and Support for Underserved Communities Through the Federal Government, NASA is seeking to advance equity or remove barriers for members of underserved communities related to this requirement. As defined in the EO, Underserved Communities refers to populations sharing a particular characteristic, as well as geographic communities, that have been systematically denied a full opportunity to participate in aspects of economic, social, and civic life, as exemplified by the list in the preceding definition of \"equity.\" Equity means the consistent and systematic fair, just, and impartial treatment of all individuals, including individuals who belong to underserved communities that have been denied such treatment, such as Black, Latino, and Indigenous and Native American persons, Asian Americans and Pacific Islanders and other persons of color; members of religious minorities; lesbian, gay, bisexual, transgender, and queer (LGBTQ+) persons; persons with disabilities; persons who live in rural areas; and persons otherwise adversely affected by persistent poverty or inequality. All comments or questions shall be submitted electronically via email to kodi.d.coles@nasa.gov, no later than July 22, 2024, 12:00PM Eastern Standard Time. The response shall be submitted electronically as a Microsoft Word .doc, Adobe .pdf, and/or Microsoft EXCEL .xls file. NASA Clause 1852.215-84, Ombudsman, is applicable. The Center Ombudsman for this acquisition can be found at : https://www.hq.nasa.gov/office/procurement/regs/Procurement-Ombuds-Comp-Advocate-Listing.pdf This synopsis is for information and planning purposes only and is not to be construed as a commitment by the Government nor will the Government pay for information solicited. Respondents will not be notified of the results of the evaluation.","origin":"extract"},"notice_type":{"code":"r","label":"Sources Sought"},"schema_version":1,"solicitation_number":"80KSC024RFI0001","place_of_performance":{"city":{"name":"Merritt Island"},"state":{"code":"FL"},"country":{"code":"USA"}},"product_service_code":"6640"}],"due_at":"2024-07-24T16:00:00Z","due_date":"2024-07-24","closes_at":"2024-07-24T16:00:00Z","awardable":true,"dept_key":"d-080","dept_name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION","sub_key":"s-8000","sub_name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION","office_key":"o-80KSC0","office_name":"NASA KENNEDY SPACE CENTER","state":"FL","county":"12009","county_name":"Brevard County","city":"1244275","city_name":"Merritt Island","country":"USA","winner_key":null,"amount":null,"linked_awards":0,"cancelled":false,"archived":false,"updated_at":"2026-09-16T21:18:12.857524Z","principal_notice_id":"1451ecafeec64350b0bf082b691ecf5b","description":{"text":"Integrated High-Vacuum Atomic Force Microscopy Kennedy Space Center (KSC) Request for Information (RFI) NASA Kennedy Space Center (KSC) is hereby soliciting information from potential sources for Integrated High-Vacuum Atomic Force Microscopy. The NASA Kennedy Space Center (KSC) is seeking capability statements from all interested parties, including all socioeconomic categories of Small Businesses and Historically Black Colleges and Universities (HBCU)/Minority Institutions (MI), and members of the underserved communities as defined by Executive Order 13985, Advancing Racial Equity And Support For Underserved Communities Through The Federal Government, for the purposes of determining the appropriate level of competition and/or small business subcontracting goals for Integrated High-Vacuum Atomic Force Microscopy. The Government reserves the right to consider a Small, 8(a), Women-owned (WOSB), Service-Disabled Veteran (SD-VOSB), Economically Disadvantaged Women-owned Small Business (EDWOSB) or HUBZone business set-aside based on responses received. See Attachment 1 for the requirements document. No solicitation exists; therefore, do not request a copy of the solicitation. If a solicitation is released, it will be synopsized on SAM.gov. Interested firms are responsible for monitoring this website for the release of any solicitation or synopsis. Vendors having the capabilities necessary to meet or exceed the stated requirements are invited to submit appropriate documentation, literature, brochures, and references. In responding to this notice, please DO NOT PROVIDE PROPRIETARY INFORMATION. HOW TO RESPOND TO THIS NOTICE: Provide the complete name of your company, address, name of contact for follow-up questions, their email, their phone number and, if your company has an active registration in https://sam.gov, your company’s Unique Entity ID (UEI). Identify laboratory equipment that your company sells that is of the nature addressed in the Attachment 1 of this notice. Include brand name, make, model, and/or other distinguishing information. State if your company is the manufacturer of the identified equipment or is a retailer or wholesaler that normally sells the identified equipment. If the latter, indicate whether the manufacturer authorized in writing for your company to sell the identified equipment on behalf of the manufacturer. Identify any aspects of this market research notice, including instructions, and draft minimum specifications that could be viewed as unduly restrictive or contain unnecessary barriers that adversely affect your ability to fully participate and indicate why. In such a scenario, please offer suggestions for how the market research notice and draft minimum specifications could be made more inclusive and competitive. For the NAICS code listed in this notice: Indicate whether your company is (a) a small business or (b) other than small business. If you believe the NAICS code listed in this notice is not the best NAICS code for the type of product addressed in this notice, identify an alternative NAICS code that you believe would be more appropriate for the planned procurement. Describe standard terms and conditions of sale offered by your company for the aforementioned equipment such as: delivery time after your company accepts the order; FOB shipping terms: manufacturer warranty (including details regarding nature and duration); if available, description(s) of available extended warranty; equipment setup and test; operator and service instruction manual(s); cleanup after installation; and if applicable, other offered services. Provide a copy of manufacturer standard terms and conditions that typically relate to the sale of the specified equipment, if available. State published price, discount, or rebate arrangements for aforementioned equipment; and/or provide link to access company’s published prices for equipment and services. If the aforementioned equipment and related services are available for purchase on any existing Federal Supply Schedule contract(s) or other contracts against which may be able place orders, identify the contract number(s) and other relevant information. Please advise if the requirement is considered to be a commercial or commercial-type product. A commercial item is defined in FAR 2.101. Additionally, in support of the Executive Order (EO) 13985, Advancing Racial Equity and Support for Underserved Communities Through the Federal Government, NASA is seeking to advance equity or remove barriers for members of underserved communities related to this requirement. As defined in the EO, Underserved Communities refers to populations sharing a particular characteristic, as well as geographic communities, that have been systematically denied a full opportunity to participate in aspects of economic, social, and civic life, as exemplified by the list in the preceding definition of \"equity.\" Equity means the consistent and systematic fair, just, and impartial treatment of all individuals, including individuals who belong to underserved communities that have been denied such treatment, such as Black, Latino, and Indigenous and Native American persons, Asian Americans and Pacific Islanders and other persons of color; members of religious minorities; lesbian, gay, bisexual, transgender, and queer (LGBTQ+) persons; persons with disabilities; persons who live in rural areas; and persons otherwise adversely affected by persistent poverty or inequality. All comments or questions shall be submitted electronically via email to kodi.d.coles@nasa.gov, no later than July 22, 2024, 12:00PM Eastern Standard Time. The response shall be submitted electronically as a Microsoft Word .doc, Adobe .pdf, and/or Microsoft EXCEL .xls file. NASA Clause 1852.215-84, Ombudsman, is applicable. The Center Ombudsman for this acquisition can be found at : https://www.hq.nasa.gov/office/procurement/regs/Procurement-Ombuds-Comp-Advocate-Listing.pdf This synopsis is for information and planning purposes only and is not to be construed as a commitment by the Government nor will the Government pay for information solicited. Respondents will not be notified of the results of the evaluation.","html":null,"origin":"extract"},"contacts":[{"name":"Kodi Coles","role":"primary","email":"kodi.d.coles@nasa.gov","phone":"3218670299"}],"place_of_performance":{"city":{"name":"Merritt Island"},"state":{"code":"FL"},"country":{"code":"USA"}},"office_address":{"zip":"32899","city":"KENNEDY SPACE CENTER","state":"FL","country":"USA"},"naics_codes":["334516"],"award":null,"attachments":[],"awards":[],"related":[{"key":"80KSC026Q0013","latest_notice_id":"da9dfe20c9084dbc89b5ce3169dbdcce","title":"Environmental Control System","solicitation_number":"80KSC026Q0013","notice_type":"k","first_type":"k","first_posted":"2026-09-17","last_posted":"2026-09-17","notices":1,"due_at":"2026-10-02T14:00:00Z","due_date":"2026-10-02","closes_at":"2026-10-02T14:00:00Z","awardable":true,"open":true,"dept_key":"d-080","dept_name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION","sub_key":"s-8000","sub_name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION","office_key":"o-80KSC0","office_name":"NASA KENNEDY SPACE CENTER","naics":"333413","psc":"4310","set_aside":null,"state":"FL","county":"12009","county_name":"Brevard County","city":null,"city_name":null,"country":"USA","winner":null,"winner_key":null,"amount":null,"linked_awards":0,"cancelled":false,"archived":false,"updated_at":"2026-09-18T04:00:44.545196Z"},{"key":"RFP10990021REVU","latest_notice_id":"d7eb5d70e9fe4bdc8a2c840a5bebff3f","title":"NASA Launch Services II (NLS-II) 2026 On-Ramp","solicitation_number":"RFP10-99-0021-Rev_U","notice_type":"r","first_type":"r","first_posted":"2026-09-04","last_posted":"2026-09-04","notices":1,"due_at":"2026-10-05T20:00:00Z","due_date":"2026-10-05","closes_at":"2026-10-05T20:00:00Z","awardable":true,"open":true,"dept_key":"d-080","dept_name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION","sub_key":"s-8000","sub_name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION","office_key":"o-80KSC0","office_name":"NASA KENNEDY SPACE CENTER","naics":"336414","psc":"V126","set_aside":null,"state":null,"county":null,"county_name":null,"city":null,"city_name":null,"country":null,"winner":null,"winner_key":null,"amount":null,"linked_awards":0,"cancelled":false,"archived":false,"updated_at":"2026-09-16T21:18:12.857524Z"},{"key":"AFPKSCEXPARKPARCELS3AND42026","latest_notice_id":"e17b7deb0d014416b0790199f6d507c6","title":"AFP - Lease of Vacant, Undeveloped Land in Exploration Park at Kennedy Space Center","solicitation_number":"AFP-KSC-ExParkParcels3and4-2026","notice_type":"o","first_type":"o","first_posted":"2026-09-04","last_posted":"2026-09-04","notices":1,"due_at":"2026-11-06T22:00:00Z","due_date":"2026-11-06","closes_at":"2026-11-06T22:00:00Z","awardable":true,"open":true,"dept_key":"d-080","dept_name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION","sub_key":"s-8000","sub_name":"NATIONAL AERONAUTICS AND SPACE ADMINISTRATION","office_key":"o-80KSC0","office_name":"NASA KENNEDY SPACE CENTER","naics":"53","psc":"X1PC","set_aside":null,"state":"FL","county":"12009","county_name":"Brevard County","city":"1244275","city_name":"Merritt Island","country":"USA","winner":null,"winner_key":null,"amount":null,"linked_awards":0,"cancelled":false,"archived":false,"updated_at":"2026-09-16T21:18:12.857524Z"}]}