# Licensing Opportunity: Wavefront Distortion Correction in Microscopy Image

Canonical: https://abierto.us/opportunities/20240911m

- Solicitation number: 2024-09-11_M
- Notice type: Special notice
- Status: Closed. Deadline was October 26, 2024 at 5:00 PM EDT
- Department: Department of Energy
- Contracting office: ORNL Ut-Battelle LLC-DOE Contractor (899042)
- Place of performance: Oak Ridge, Tennessee
- County: Anderson County (FIPS 47001). https://abierto.us/counties/anderson-county-tn-47001
- City: Oak Ridge. https://abierto.us/cities/oak-ridge-tn-4755120
- First posted: September 11, 2024
- Last posted: September 11, 2024
- SAM.gov: https://sam.gov/workspace/contract/opp/34a0a43f59a34a3888203da6de51f4a4/view

## Description

**Invention Reference Number:** 202405644 Distortion in scanning tunneling microscope (STM) images is an unavoidable problem. This technology is an algorithm to identify and correct distorted wavefronts in atomic resolution STM images. This algorithm can be used to correct nonlinear in-plane distortions without prior knowledge of the physical scanning parameters, the characteristics of the piezoelectric actuator, or individual atom positions.

Description This is a wavefront correction algorithm that provides a facile approach for correcting nonlinearly distortions in 2D lattice images in scanning tunneling microscopes. This allows correction of distorted STM images even when locating each atom position is challenging. In the correction algorithm, distorted wavefronts are easily identified using a wavefront vector field.

The algorithm then transforms distorted wavefronts into straight lines by moving each point in the STM image along the wavefront to preserve atomic order to produce a linearly distorted image, which can finally be corrected by a linear transformation.

Benefits Drastically reduces distortions Wavefront vector field can be generated even when the sample rate is low Method is complementary to existing post-processing algorithms, but does not require foreknown order or atomic lattice positions Does not require any physical scanning parameters Applicable to all topographic and spectroscopic data regardless of the nature of distortions Applications and Industries Scanning tunneling microscope manufacturers Electron microscope manufacturers STM users TEM users Atomic resolution instrumentation manufacturers Contact To learn more about this technology, email partnerships@ornl.gov or call 865-574-1051.

## Publications

- September 11, 2024: Special notice, due October 26, 2024 at 5:00 PM EDT. Notice 34a0a43f59a34a3888203da6de51f4a4. https://sam.gov/workspace/contract/opp/34a0a43f59a34a3888203da6de51f4a4/view

## Points of contact

- Leslie Smith, smithlm@ornl.gov, 8653410373

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Source: SAM.gov Contract Opportunities bulk extract. Confirm deadlines on SAM.gov before responding. Cite https://abierto.us/opportunities/20240911m.