# Microscope Components

Canonical: https://abierto.us/opportunities/1333nd24qnb030371

- Solicitation number: 1333ND24QNB030371
- Notice type: Award notice (first published as combined synopsis and solicitation)
- Status: Awarded to Seiwa Optical America Inc. for $25,365.00
- Department: Department of Commerce
- Agency: National Institute of Standards and Technology
- Contracting office: Department of Commerce NIST (1333ND)
- NAICS: 334516 Analytical Laboratory Instrument Manufacturing
- Product or service code: 6640 Laboratory Equipment and Supplies
- Place of performance: Boulder, Colorado
- County: Boulder County (FIPS 08013). https://abierto.us/counties/boulder-county-co-08013
- City: Boulder. https://abierto.us/cities/boulder-co-0807850
- First posted: June 27, 2024
- Last posted: September 4, 2024
- SAM.gov: https://sam.gov/workspace/contract/opp/93a667355d2a4794ac89361e9fa074b0/view

## Description

Advanced semiconductor technology has led to continuous performance improvements in transistors. However, many iterations are needed to obtain optimal performance and the yield and reproducibility is incredibly poor. Furthermore, US chip makers are ill-equipped with legacy measurement techniques and underperforming models.

We propose a robust path to develop and verify high-frequency transistor models: 1) new on-wafer standards and calibration, 2) precision noise measurements for transistor quality assurance, 3) improved characterizations, 4) optimal models tailored to a given technology, and 5) transistor model verification across frequency with key performance indicators.?

The National Institute of Standards and Technology (NIST) Radio Frequency (RF) technology division is seeking inspection microscope components to build custom manual probe stations dedicated to the characterization of active devices and circuits above 100 GHz. The solution must include 4k cameras, objective lenses of several magnifications, and manual Z focus blocks.

This solution will enable transistor large-signal characterization that will be used to extract and validate transistor models under the CHIPS program. See attachment for complete notice details

## Award on USAspending

- Recipient: Seiwa Optical America Inc. (UEI CSDMK57C34M6)
- Contract: 1333ND24PNB030442, purchase order
- Obligated: $25,365.00
- Competition: Competed Under SAP, 5 offers received
- Link: award number 1333ND24PNB030442 equals the contract number; same awarding office 1333ND (high confidence)
- Record: https://www.usaspending.gov/award/CONT_AWD_1333ND24PNB030442_1341_-NONE-_-NONE-/


## Publications

- June 27, 2024: Combined synopsis and solicitation, due July 12, 2024 at 12:00 PM EDT. Notice 52c8c9355bb64d88957d4066271ff710. https://sam.gov/workspace/contract/opp/52c8c9355bb64d88957d4066271ff710/view
- September 4, 2024: Award notice. Notice 93a667355d2a4794ac89361e9fa074b0. https://sam.gov/workspace/contract/opp/93a667355d2a4794ac89361e9fa074b0/view

## Points of contact

- Joni L. Laster, joni.laster@nist.gov
- Forest Crumpler, forest.crumpler@nist.gov

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Source: SAM.gov Contract Opportunities bulk extract and USAspending.gov award data. Confirm deadlines on SAM.gov before responding. Cite https://abierto.us/opportunities/1333nd24qnb030371.