{"canonical":"https://abierto.us/opportunities/1333nd24qnb030291","key":"1333ND24QNB030291","url":"https://abierto.us/opportunities/1333nd24qnb030291","title":"CHIPS R&D: PHOTORESIST ATOMIC FORCE MICROSCOPE (AFM)","solicitation_number":"1333ND24QNB030291","notice_type":"a","open":false,"response_deadline":"2024-06-14T16:00:00Z","first_posted":"2024-05-30","last_posted":"2024-08-29","department":"COMMERCE, DEPARTMENT OF","subagency":"NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY","office":"DEPT OF COMMERCE NIST","naics":"334516","psc":"6640","set_aside":null,"place_state":"MD","place_county":"24031","place_county_name":"Montgomery County","place_city":"2431175","place_city_name":"Gaithersburg","winner":"OXFORD INSTRUMENTS ASYLUM RESEARCH, INC.","award_amount":"703897.00","publications":[{"notice_id":"48a1f74156ac486d9485d0c27e7bedea","title":"CHIPS R&D: PHOTORESIST ATOMIC FORCE MICROSCOPE (AFM)","solicitation_number":"1333ND24QNB030291","notice_type":"k","base_type":"k","posted":"2024-05-30","posted_at":null,"due_at":"2024-06-14T16:00:00Z","due_date":"2024-06-14","cancelled":null,"archived":null,"archive_date":"2024-06-29","award_number":null,"awardee_name":null,"amount":null,"link_sam":"https://sam.gov/workspace/contract/opp/48a1f74156ac486d9485d0c27e7bedea/view","enriched":false,"history":[]},{"notice_id":"b2020919b614488e85e494c8afa64443","title":"CHIPS R&D: PHOTORESIST ATOMIC FORCE MICROSCOPE (AFM)","solicitation_number":"1333ND24PNB030407","notice_type":"a","base_type":"k","posted":"2024-08-29","posted_at":null,"due_at":null,"due_date":null,"cancelled":null,"archived":null,"archive_date":"2024-09-13","award_number":"1333ND24PNB030407","awardee_name":"OXFORD INSTRUMENTS ASYLUM RESEARCH, INC. Goleta","amount":"703897.00","link_sam":"https://sam.gov/workspace/contract/opp/b2020919b614488e85e494c8afa64443/view","enriched":false,"history":[]}],"latest_notice_id":"b2020919b614488e85e494c8afa64443","first_type":"k","notices":[{"dates":{"posted":"2024-05-30","response_deadline":{"raw":"2024-06-14T12:00:00-04:00","utc":"2024-06-14T16:00:00Z","date":"2024-06-14","time":"12:00:00","utc_offset_seconds":-14400}},"links":{"sam":"https://sam.gov/workspace/contract/opp/48a1f74156ac486d9485d0c27e7bedea/view"},"naics":{"codes":["334516"],"primary":"334516"},"title":"CHIPS R&D: PHOTORESIST ATOMIC FORCE MICROSCOPE (AFM)","agency":{"office":{"code":"1333ND","name":"DEPT OF COMMERCE NIST"},"subtier":{"code":"1341","name":"NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY"},"department":{"code":"013","name":"COMMERCE, DEPARTMENT OF"},"office_address":{"zip":"20899","city":"GAITHERSBURG","state":"MD","country":"USA"},"organization_type":"OFFICE"},"status":{"active":false,"archive_date":"2024-06-29","archive_type":"auto15"},"contacts":[{"name":"Joni L. Laster","role":"primary","email":"joni.laster@nist.gov"},{"name":"Forest Crumpler","role":"secondary","email":"forest.crumpler@nist.gov"}],"base_type":{"code":"k","label":"Combined Synopsis/Solicitation"},"notice_id":"48a1f74156ac486d9485d0c27e7bedea","provenance":{"extract":{"url":"https://s3.amazonaws.com/falextracts/Contract%20Opportunities/Archived%20Data/FY2024_archived_opportunities.csv","etag":"\"d582488fe153a9f11bf629913d176ffc-137\"","fetched_at":"2026-09-16T19:07:39.720164Z","row_sha256":"508550d9a3216723e4c9b226cfda14d629778abc8787f79afa1fd2cf400bc16e","last_modified":"2026-09-13T14:47:40Z"},"updated_at":"2026-09-16T19:07:39.720164Z","first_seen_at":"2026-09-16T19:07:39.720164Z"},"description":{"text":"The CHIPS Metrology Program at NIST advances metrology for accelerating R&D and for developing breakthroughs that support the development of the next-generation microelectronics and ensure the competitiveness and leadership of the United States. The Microsystems and Nanotechnology Division develops micro-/nano-fabrication technologies, devices and novel measurement methods enabled by integrated microsystems. The National Institute of Standards and Technology (NIST) CHIPS metrology program has a requirement for a customized fluid immersion atomic force microscope (AFM) to develop advanced in-situ measurement methods of physical-chemical processes at the solid-liquid interfaces with relevance to semiconductor manufacturing. The measurement goal is to measure rapid changes in surface topography in response to the introduction of a liquid chemical reagent. In addition to using conventional cantilever probes, the AFM will be adapted to use custom chip-scale optomechanical probes developed at NIST to achieve high bandwidth, combined with high deflection sensitivity and low perturbation during fluid exchange. A system upgradeable to video-rate imaging is required. Please see the attachments for the full notice details...","origin":"extract"},"notice_type":{"code":"k","label":"Combined Synopsis/Solicitation"},"schema_version":1,"solicitation_number":"1333ND24QNB030291","place_of_performance":{"zip":"20899","city":{"name":"Gaithersburg"},"state":{"code":"MD"},"country":{"code":"USA"}},"product_service_code":"6640"},{"award":{"date":"2024-08-29","amount":"703897.00","number":"1333ND24PNB030407","awardee":{"raw":"OXFORD INSTRUMENTS ASYLUM RESEARCH, INC. Goleta CA 93117 USA","name":"OXFORD INSTRUMENTS ASYLUM RESEARCH, INC. Goleta","location":{"zip":"93117","state":{"code":"CA"},"country":{"code":"USA"}}}},"dates":{"posted":"2024-08-29","award_date":"2024-08-29"},"links":{"sam":"https://sam.gov/workspace/contract/opp/b2020919b614488e85e494c8afa64443/view"},"naics":{"codes":["334516"],"primary":"334516"},"title":"CHIPS R&D: PHOTORESIST ATOMIC FORCE MICROSCOPE (AFM)","agency":{"office":{"code":"1333ND","name":"DEPT OF COMMERCE NIST"},"subtier":{"code":"1341","name":"NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY"},"department":{"code":"013","name":"COMMERCE, DEPARTMENT OF"},"office_address":{"zip":"20899","city":"GAITHERSBURG","state":"MD","country":"USA"},"organization_type":"OFFICE"},"status":{"active":false,"archive_date":"2024-09-13","archive_type":"auto15"},"contacts":[{"name":"Joni L. Laster","role":"primary","email":"joni.laster@nist.gov"},{"name":"Forest Crumpler","role":"secondary","email":"forest.crumpler@nist.gov"}],"base_type":{"code":"k","label":"Combined Synopsis/Solicitation"},"notice_id":"b2020919b614488e85e494c8afa64443","provenance":{"extract":{"url":"https://s3.amazonaws.com/falextracts/Contract%20Opportunities/Archived%20Data/FY2024_archived_opportunities.csv","etag":"\"d582488fe153a9f11bf629913d176ffc-137\"","fetched_at":"2026-09-16T19:07:39.720164Z","row_sha256":"4cbf39d0b226d9beeadffe2035ecc1ac1b5a90dda6d2fc041f7e2c8516f1cfe9","last_modified":"2026-09-13T14:47:40Z"},"updated_at":"2026-09-16T19:07:39.720164Z","first_seen_at":"2026-09-16T19:07:39.720164Z"},"notice_type":{"code":"a","label":"Award Notice"},"schema_version":1,"solicitation_number":"1333ND24PNB030407","place_of_performance":{"zip":"20899","city":{"name":"Gaithersburg"},"state":{"code":"MD"},"country":{"code":"USA"}},"product_service_code":"6640"}],"due_at":"2024-06-14T16:00:00Z","due_date":"2024-06-14","closes_at":"2024-06-14T16:00:00Z","awardable":false,"dept_key":"d-013","dept_name":"COMMERCE, DEPARTMENT OF","sub_key":"s-1341","sub_name":"NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY","office_key":"o-1333ND","office_name":"DEPT OF COMMERCE NIST","state":"MD","county":"24031","county_name":"Montgomery County","city":"2431175","city_name":"Gaithersburg","country":"USA","winner_key":"Q365CKN56793","amount":"703897.00","linked_awards":2,"cancelled":false,"archived":false,"updated_at":"2026-09-16T21:18:12.857524Z","principal_notice_id":"48a1f74156ac486d9485d0c27e7bedea","description":{"text":"The CHIPS Metrology Program at NIST advances metrology for accelerating R&D and for developing breakthroughs that support the development of the next-generation microelectronics and ensure the competitiveness and leadership of the United States. The Microsystems and Nanotechnology Division develops micro-/nano-fabrication technologies, devices and novel measurement methods enabled by integrated microsystems. The National Institute of Standards and Technology (NIST) CHIPS metrology program has a requirement for a customized fluid immersion atomic force microscope (AFM) to develop advanced in-situ measurement methods of physical-chemical processes at the solid-liquid interfaces with relevance to semiconductor manufacturing. The measurement goal is to measure rapid changes in surface topography in response to the introduction of a liquid chemical reagent. In addition to using conventional cantilever probes, the AFM will be adapted to use custom chip-scale optomechanical probes developed at NIST to achieve high bandwidth, combined with high deflection sensitivity and low perturbation during fluid exchange. A system upgradeable to video-rate imaging is required. Please see the attachments for the full notice details...","html":null,"origin":"extract"},"contacts":[{"name":"Joni L. Laster","role":"primary","email":"joni.laster@nist.gov"},{"name":"Forest Crumpler","role":"secondary","email":"forest.crumpler@nist.gov"}],"place_of_performance":{"zip":"20899","city":{"name":"Gaithersburg"},"state":{"code":"MD"},"country":{"code":"USA"}},"office_address":{"zip":"20899","city":"GAITHERSBURG","state":"MD","country":"USA"},"naics_codes":["334516"],"award":null,"attachments":[],"awards":[{"award_key":"CONT_AWD_1333ND24PNB030407_1341_-NONE-_-NONE-","permalink":"https://www.usaspending.gov/award/CONT_AWD_1333ND24PNB030407_1341_-NONE-_-NONE-/","piid":"1333ND24PNB030407","parent_piid":null,"award_type":"PURCHASE ORDER","vendor_key":"Q365CKN56793","recipient_name":"OXFORD INSTRUMENTS ASYLUM RESEARCH, INC.","recipient_uei":"Q365CKN56793","recipient_cage":"711V0","recipient_city":"GOLETA","recipient_state":"CA","sub_name":"National Institute of Standards and Technology","office_name":"DEPT OF COMMERCE NIST","office_key":"o-1333ND","first_action_date":"2024-08-29","last_action_date":"2025-08-14","actions":2,"obligated":"703897.00","current_total_value":"703897.00","potential_total_value":"703897.00","naics":"334516","psc":"5961","extent_competed":"COMPETED UNDER SAP","set_aside":"NO SET ASIDE USED.","offers_received":3,"description":"ATOMIC FORCE MICROSCOPE","method":"piid","confidence":"high","evidence":["award number 1333ND24PNB030407 equals the contract number","same awarding office 1333ND"],"opportunity_key":null,"opportunity_title":null}],"related":[{"key":"NB6440202601484","latest_notice_id":"449a7c4adf2b4eaab13b8dd98e387d11","title":"AploPrep Liquid Handler & Nanoimager Microscope Maintenance","solicitation_number":"NB644020-26-01484","notice_type":"p","first_type":"p","first_posted":"2026-09-04","last_posted":"2026-09-04","notices":1,"due_at":"2026-09-18T14:00:00Z","due_date":"2026-09-18","closes_at":"2026-09-18T14:00:00Z","awardable":true,"open":true,"dept_key":"d-013","dept_name":"COMMERCE, DEPARTMENT OF","sub_key":"s-1341","sub_name":"NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY","office_key":"o-1333ND","office_name":"DEPT OF COMMERCE NIST","naics":"334516","psc":"6640","set_aside":null,"state":"MD","county":"24031","county_name":"Montgomery County","city":"2431175","city_name":"Gaithersburg","country":"USA","winner":null,"winner_key":null,"amount":null,"linked_awards":0,"cancelled":false,"archived":false,"updated_at":"2026-09-16T21:18:12.857524Z"},{"key":"NB3050002602052","latest_notice_id":"dddcb96ba884450c9d6e7c80e2afcf6e","title":"Gas Cylinders","solicitation_number":"NB305000-26-02052","notice_type":"p","first_type":"p","first_posted":"2026-09-04","last_posted":"2026-09-04","notices":1,"due_at":"2026-09-18T14:00:00Z","due_date":"2026-09-18","closes_at":"2026-09-18T14:00:00Z","awardable":true,"open":true,"dept_key":"d-013","dept_name":"COMMERCE, DEPARTMENT OF","sub_key":"s-1341","sub_name":"NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY","office_key":"o-1333ND","office_name":"DEPT OF COMMERCE NIST","naics":"332420","psc":"8120","set_aside":null,"state":"MD","county":"24031","county_name":"Montgomery County","city":"2431175","city_name":"Gaithersburg","country":"USA","winner":null,"winner_key":null,"amount":null,"linked_awards":0,"cancelled":false,"archived":false,"updated_at":"2026-09-16T21:18:12.857524Z"},{"key":"1333ND26QNB030595","latest_notice_id":"8a857946d96b441d98ed529122059e53","title":"Ultra-High Vacuum (UHV) Translation Stages","solicitation_number":"1333ND26QNB030595","notice_type":"o","first_type":"o","first_posted":"2026-09-14","last_posted":"2026-09-14","notices":1,"due_at":"2026-09-18T15:00:00Z","due_date":"2026-09-18","closes_at":"2026-09-18T15:00:00Z","awardable":true,"open":true,"dept_key":"d-013","dept_name":"COMMERCE, DEPARTMENT OF","sub_key":"s-1341","sub_name":"NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY","office_key":"o-1333ND","office_name":"DEPT OF COMMERCE NIST","naics":"334516","psc":"6650","set_aside":null,"state":"MD","county":"24031","county_name":"Montgomery County","city":"2431175","city_name":"Gaithersburg","country":"USA","winner":null,"winner_key":null,"amount":null,"linked_awards":0,"cancelled":false,"archived":false,"updated_at":"2026-09-16T21:18:12.857524Z"},{"key":"1333ND26QNB680592","latest_notice_id":"da330fb6a7dc40edab39f5103b5f94ae","title":"NIST Femtosecond Laser System","solicitation_number":"1333ND26QNB680592","notice_type":"k","first_type":"k","first_posted":"2026-09-14","last_posted":"2026-09-14","notices":1,"due_at":"2026-09-18T16:00:00Z","due_date":"2026-09-18","closes_at":"2026-09-18T16:00:00Z","awardable":true,"open":true,"dept_key":"d-013","dept_name":"COMMERCE, DEPARTMENT OF","sub_key":"s-1341","sub_name":"NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY","office_key":"o-1333ND","office_name":"DEPT OF COMMERCE NIST","naics":"334516","psc":"6650","set_aside":null,"state":"MD","county":"24031","county_name":"Montgomery County","city":"2431175","city_name":"Gaithersburg","country":"USA","winner":null,"winner_key":null,"amount":null,"linked_awards":0,"cancelled":false,"archived":false,"updated_at":"2026-09-16T21:18:12.857524Z"},{"key":"1333ND26QNB730401","latest_notice_id":"cd8a4650cdfa4fb3ac6533959c354df6","title":"Brand Name Only: FLIR Thermal Camera Bundle","solicitation_number":"1333ND26QNB730401","notice_type":"o","first_type":"o","first_posted":"2026-07-27","last_posted":"2026-09-15","notices":5,"due_at":"2026-09-18T16:00:00Z","due_date":"2026-09-18","closes_at":"2026-09-18T16:00:00Z","awardable":true,"open":true,"dept_key":"d-013","dept_name":"COMMERCE, DEPARTMENT OF","sub_key":"s-1341","sub_name":"NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY","office_key":"o-1333ND","office_name":"DEPT OF COMMERCE NIST","naics":"334516","psc":"6640","set_aside":"SBA","state":"MD","county":"24031","county_name":"Montgomery County","city":"2431175","city_name":"Gaithersburg","country":"USA","winner":null,"winner_key":null,"amount":null,"linked_awards":0,"cancelled":false,"archived":false,"updated_at":"2026-09-16T21:18:12.857524Z"}]}